Focusing on oxide semiconductor devices, low-temperature BEOL fabrication, p-type CMOS technologies with a background in materials science and optoelectronics.
Photonics integration and 2D nanomaterials for computing and data processing, with expertise in ultrafast spectroscopy, charge-carrier dynamics, photodetectors, and microelectronics fabrication.
Specialises in semiconductor failure analysis, package reliability, data architecture and automation, with current research focused on physics-informed machine learning for improved device failure-analysis tools.